Genetic analyses of the major and minor locus groups of bacterial wilt resistance in tobacco using a diallel cross design

Qian, Y. L.; Sun, X. Y.; Chen, J.; Dong, J. J.; Liu, Y. H.; Xue, B. Y.; Shao, F. W.; Wu, Z. C.; SCI

机构： Anhui Acad Agr Sci, Tobacco Res Inst, Hefei, Peoples R China; Anhui Acad Agr Sci, Inst Agr Econ & Informat, Hefei, Peoples R China; China Natl Tobacco Corp, Anhui Prov Corp, Hefei, Peoples R China; Chinese Acad Agr Sci, Inst Crop Sci, Beijing 100193, Peoples R China;

来源：GENETICS AND MOLECULAR RESEARCH年份：2016

关键词： Tobacco bacterial wilt Major and minor locus groups Genetic analysis Bacterial wilt resistance in tobacco